James Webb Space Telescope Primary and Secondary Mirror Segment Assemblies Cleaning: a Quantitative Assessment

The James Webb Space Telescope Primary Mirror Segment Assemblies (PMSAs) and Secondary Mirror Assembly (SMA) were cleaned at the Johnson Space Center (JSC) in January 2018. In order to quantify the effectiveness of the cleaning, the same cleaning process was performed on the PMSA and SMA traveling witness wafers. These wafers have accompanied their respective mirror segments from their arrival at the Goddard Space Flight Center, through transport to JSC, and ultimately their exposure in Chamber A for cryogenic testing. The traveling wafers were analyzed using an Image Analysis automated microscope both prior to and after the cleaning. The resulting data showed that the PMSA wafers' Percent Area Coverage (PAC) reduced by 83.5% on average, from 0.1524 PAC to 0.0251 PAC. The SMA wafer's PAC decreased by 97.2%, from 0.1194 PAC to 0.0034 PAC. Further analysis of the particle size bins was completed in order to calculate their particle distribution slopes. The slope of the PMSA wafers increased by 0.025 on average, and the SMA wafer slope increased by 0.066. This indicates that the ratio of large to small particles slightly increased after the cleaning across all mirror segments. Visual inspections of the wafers and the flight PMSAs and SMA showed considerable and comparable particulate coverage improvements, thus leading to the conclusion that the average PAC on the PMSAs and SMA improved by the same factor as their respective wafers.